WS 2024
| Lecture | Type | SPPS | ECTS-Credits | Course number |
|---|---|---|---|---|
| Introduction to Machine Learning | ILV | 3,5 | 5,0 | M2.08760.11.051 |
| Lecture | Type | SPPS | ECTS-Credits | Course number |
|---|---|---|---|---|
| Introduction to Machine Learning | ILV | 3,5 | 5,0 | M2.08760.11.051 |
| Lecture | Type | SPPS | ECTS-Credits | Course number |
|---|---|---|---|---|
| Introduction to Machine Learning | ILV | 3,5 | 5,0 | M2.08760.11.051 |
| Lecture | Type | SPPS | ECTS-Credits | Course number |
|---|---|---|---|---|
| Introduction to Machine Learning | ILV | 3,5 | 5,0 | M2.08760.11.051 |
| Titel | Autor | Jahr |
|---|---|---|
| Automated Detection and Counting of Dislocations in Scanning Electron Microscopy Images Using Classical and Machine Learning-Based Image Segmentation | Eva Sarah Schwarzl | 2025 |
| AUTOMATED DETECTION AND HIGHLIGHTING OF CONTEXTUAL OUTLIERS ON PVT DATA | Karen Paola García Cabrera | 2025 |
| Analysis of damage structures in microelectronics using computer vision | Ana Maria Jaramillo Rojas | 2024 |
| OPTIMIZING THE VERIFICATION PROCESS FOR COMPLEX CHIP DESIGNS USING ARTIFICIAL INTELLIGENCE AND MACHINE LEARNING TOOLS | Ahmed Hesham Elsayed Mahmoud Moussa | 2024 |
| Identification and analysis of weak-performing subsets to enhance data-centric model development | Dominic Zarre | 2023 |
| Titel | Autor | Jahr |
|---|---|---|
| Automated Detection and Counting of Dislocations in Scanning Electron Microscopy Images Using Classical and Machine Learning-Based Image Segmentation | Eva Sarah Schwarzl | 2025 |
| AUTOMATED DETECTION AND HIGHLIGHTING OF CONTEXTUAL OUTLIERS ON PVT DATA | Karen Paola García Cabrera | 2025 |
| Titel | Autor | Jahr |
|---|---|---|
| Analysis of damage structures in microelectronics using computer vision | Ana Maria Jaramillo Rojas | 2024 |
| OPTIMIZING THE VERIFICATION PROCESS FOR COMPLEX CHIP DESIGNS USING ARTIFICIAL INTELLIGENCE AND MACHINE LEARNING TOOLS | Ahmed Hesham Elsayed Mahmoud Moussa | 2024 |
| Titel | Autor | Jahr |
|---|---|---|
| Identification and analysis of weak-performing subsets to enhance data-centric model development | Dominic Zarre | 2023 |
| Titel | Autor | Jahr |
|---|
| Articles in Journals | ||
|---|---|---|
| Title | Author | Year |
| Feature extraction from analog wafermaps: a comparison of classical image processing and a deep generative model IEEE Transactions on Semiconductor Manufacturing, 32:190-198 | Santos, T., Schrunner, S., Geiger, B., Pfeiler, O., Zernig, A., Kästner, A., Kern, R. | 2019 |
| Conference contributions | ||
|---|---|---|
| Title | Author | Year |
| Experiences from the 1st Women in Data Science Conference in Villach, Austria in: IEEE Education Engineering (EDUCON), 19-19 May 2021 | Pfeiler, O., Kloss-Brandstätter, A. | 2021 |
| A comparison of supervised approaches for process pattern recognition in analog semiconductor wafer test data in: IEEE (Hrsg.), IEEE International Conference on Machine Learning and Applications (ICMLA 2018), 17-20 Dec 2018, Orlando, FL, USA | Schrunner, S., Pfeiler, O., Zernig, A., Kästner, A., Kern, R. | 2018 |
| Markov random fields for pattern extraction in analog wafer test data in: IEEE (Hrsg.), International Conference on Image Processing Theory, Tools and Applications (IPTA 2017), 28 Nov-01 Dec 2017, Montreal, Canada | Schrunner, S., Pfeiler, O., Zernig, A., Kästner, A., Kern, R. | 2017 |
| Conference contributions | ||
|---|---|---|
| Title | Author | Year |
| Experiences from the 1st Women in Data Science Conference in Villach, Austria in: IEEE Education Engineering (EDUCON), 19-19 May 2021 | Pfeiler, O., Kloss-Brandstätter, A. | 2021 |
| Articles in Journals | ||
|---|---|---|
| Title | Author | Year |
| Feature extraction from analog wafermaps: a comparison of classical image processing and a deep generative model IEEE Transactions on Semiconductor Manufacturing, 32:190-198 | Santos, T., Schrunner, S., Geiger, B., Pfeiler, O., Zernig, A., Kästner, A., Kern, R. | 2019 |
| Conference contributions | ||
|---|---|---|
| Title | Author | Year |
| A comparison of supervised approaches for process pattern recognition in analog semiconductor wafer test data in: IEEE (Hrsg.), IEEE International Conference on Machine Learning and Applications (ICMLA 2018), 17-20 Dec 2018, Orlando, FL, USA | Schrunner, S., Pfeiler, O., Zernig, A., Kästner, A., Kern, R. | 2018 |
| Conference contributions | ||
|---|---|---|
| Title | Author | Year |
| Markov random fields for pattern extraction in analog wafer test data in: IEEE (Hrsg.), International Conference on Image Processing Theory, Tools and Applications (IPTA 2017), 28 Nov-01 Dec 2017, Montreal, Canada | Schrunner, S., Pfeiler, O., Zernig, A., Kästner, A., Kern, R. | 2017 |
Please use this link for external references on the profile of Olivia Pfeiler: www.fh-kaernten.at/mitarbeiter-details?person=o.pfeiler
