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SS 2019
LehrveranstaltungTypSWSECTS-CreditsLV-Nummer
Modern Sensor Applications ILV 1,5 2,0 M2.05280.22.861
TitelAutorJahr
Analysis of stress stimuli and their effects in magnetic Hall sensors Haris RECEPI 2021
Measure Dynamic behavior of mid-voltage Gallium Nitride high electron mobility transistor Marco Peter Künstel 2019
Automated wafer inspection: From equipment automation to enabling image data processing Omar Mohsen Amin HUSSEIN 2018
Imprint Depth Measurement with Digital Holographic Microscope Hisham Mohamed Gouda MAHMOUD 2018
Robot paddle tilt monitoring using a raspberry pi and an optical sensor for industrial application Essa KHATATBEH 2018
Stand-alone Z-motion Measurement and Analysis System for Robotic Handling Devices in Semiconductor Fabrication Labs "RoboDoc" Khaled Ossama Eissa AMER 2018
Applications of Tunable Liquid Lenses in the Semiconductor Industry Danilo COSTA OLIVEIRA 2017
Automated monitoring of end-effectors of robotic systems with computer vision Alexandra Daniela Nitoiu 2017
Development of a Sensor-Based Wafer Handling Monitoring Kaleb IAHN REGINALDO 2017
Entwicklung einer Alternativanlage zum Umhorden von verschiedenen Wafertypen Christoph Josef Unterweger 2016
Development of a new Capacitance-Voltage Measurement for the Monitoring of EPI Processes Alen Cekic 2015
Automated CD Measurement of Thinned Wafers with Image Processing Michael Gaggl 2009
TitelAutorJahr
Analysis of stress stimuli and their effects in magnetic Hall sensors Haris RECEPI 2021
TitelAutorJahr
Measure Dynamic behavior of mid-voltage Gallium Nitride high electron mobility transistor Marco Peter Künstel 2019
TitelAutorJahr
Automated wafer inspection: From equipment automation to enabling image data processing Omar Mohsen Amin HUSSEIN 2018
Imprint Depth Measurement with Digital Holographic Microscope Hisham Mohamed Gouda MAHMOUD 2018
Robot paddle tilt monitoring using a raspberry pi and an optical sensor for industrial application Essa KHATATBEH 2018
Stand-alone Z-motion Measurement and Analysis System for Robotic Handling Devices in Semiconductor Fabrication Labs "RoboDoc" Khaled Ossama Eissa AMER 2018
TitelAutorJahr
Applications of Tunable Liquid Lenses in the Semiconductor Industry Danilo COSTA OLIVEIRA 2017
Automated monitoring of end-effectors of robotic systems with computer vision Alexandra Daniela Nitoiu 2017
Development of a Sensor-Based Wafer Handling Monitoring Kaleb IAHN REGINALDO 2017
TitelAutorJahr
Entwicklung einer Alternativanlage zum Umhorden von verschiedenen Wafertypen Christoph Josef Unterweger 2016
TitelAutorJahr
Development of a new Capacitance-Voltage Measurement for the Monitoring of EPI Processes Alen Cekic 2015
Automated CD Measurement of Thinned Wafers with Image Processing Michael Gaggl 2009
TitelAutorJahr
Commissioning of a Regularly Monitoring Equipment for Wafer Handling
  • Vlad-Teodor Frincu
  • 2019
    Einführung einer regelmäßigen Überwachung von Transporteinrichtungen für Wafer
  • Markus Gratzer
  • 2019
    Evaluierung eines neuartigen Sensorsystems zur Überwachung von Beladungsabläufen
  • Michael Siedler
  • 2019
    Migration of measurement requirements to a new database system
  • Erika Sophia Horn
  • 2019
    Abgleich aktueller Messgeräte zur Interface Trap Messung
  • Cristina Corizzo
  • 2017
    TitelAutorJahr
    Commissioning of a Regularly Monitoring Equipment for Wafer Handling
  • Vlad-Teodor Frincu
  • 2019
    Einführung einer regelmäßigen Überwachung von Transporteinrichtungen für Wafer
  • Markus Gratzer
  • 2019
    Evaluierung eines neuartigen Sensorsystems zur Überwachung von Beladungsabläufen
  • Michael Siedler
  • 2019
    Migration of measurement requirements to a new database system
  • Erika Sophia Horn
  • 2019
    TitelAutorJahr
    Abgleich aktueller Messgeräte zur Interface Trap Messung
  • Cristina Corizzo
  • 2017

    Verwenden Sie für externe Referenzen auf das Profil von Thomas Bitzer folgenden Link: www.fh-kaernten.at/mitarbeiter-details?person=t.bitzer